選択資料から書架並びで前後20冊ずつを表示します。
ISIC-91 : 4th International Symposium on IC Design, Manufacture and Applications : proceedings / organized by Nanyang Technological University School of Electrical & Electronic Engineering ; sponsored by National Science & Technology Board in cooperation with IEEE Singapore Section
2号館集密書庫(図書)
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
2号館集密書庫(図書)
VLSI and computers : proceedings / First International Conference on Computer Technology, Systems, and Applications ; edited by Walter E. Proebster and Hans Reiner. --
2号館集密書庫(図書)
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section
2号館集密書庫(図書)
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
2号館集密書庫(図書)
ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC / Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
2号館集密書庫(図書)
Proceedings / IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, August 10-12, 1987, Cornell University, Ithaca, New York ; sponsored by IEEE Electron Devices Society in cooperation with IEEE Microwave Theory and Techniques Society and Cornell University
2号館集密書庫(図書)
Digest of technical papers / Sponsored by IEEE Computer Society, IEEE Circuits and Systems Society, in cooperation with IEEE Electron Devices Society
1986
2号館集密書庫(図書)