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検索キーワード:(件名: Integrated circuits Testing Congresses)
該当件数:17件
ICMTS 94 : proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22-25, 1994, San Diego, California / sponsored by the IEEE Electron Devices Society
: soft.,: case.,: micro.. - Piscataway : IEEE Service Center , c1994
図書 <1000500461>
ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan / sponsored by the IEEE Electron Devices Society
: soft.,: case.,: micro.. - New York, NY : Institute of Electrical and Electronics Engineers , c1991
図書 <1000430631>
ICMTS 1989 : Proceedings of the 1989 International Conference on Microelectronic Test Structures, Edinburgh - Scotland, 13-14th March 1989
New York, N.Y. : Institute of Electrical and Electronics Engineers, c1989
図書 <1000356209>
ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures : March 22-25, 1993, Sitges, Barcelona, Spain / sponsored by the IEEE Electron Devices Society
: soft.,: case.,: micro.. - Piscataway : IEEE Service Center , c1992
図書 <1000477434>
ICMTS 95 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan/ sponsored by the IEEE Electron Devices Society
: soft.,: case.,: micro.. - Piscataway : IEEE Service Center , c1995
図書 <1000528023>
ICMTS 1990 : proceedings of the 1990 International Conference on Microelectronic Test Structures : March 5-7, 1990, San Diego, Calif. / sponsored by the IEEE Electron Devices Society
New York, NY : Institute of Electrical and Electronics Engineers , [1990]
図書 <1000645929>
ICMTS 1996 : 1996 IEEE International Conference on Microelectronic Test Structures : March 25-28, 1996, Trento, Italy, proceedings / sponsored by the IEEE Electron Devices Society
: soft.,: case.. - Piscataway : IEEE Service Center , c1996
図書 <1000545060>
1997 IEEE International Conference on Microelectronic Test Structures proceedings, March 17-20, 1997, Monterey, California / sponsored by the IEEE Electron Devices Society
: softbound,: casebound. - Piscataway : IEEE Service Center , c1997
図書 <1000555588>
ICMTS 92 : proceedings of the 1992 International Conference on Microelectronic Test Structures : March 16-19, 1992, San Diego, California / sponsored by the IEEE Electron Devices Society
図書 <1000453779>
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section
Washington, D.C. ; Los Angeles, CA : Computer Society Press of the IEEE : Order from Computer Society of the IEEE , c1987
図書 <1000631606>
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
Washington, D.C. : Computer Society Press of the IEEE , c1988
図書 <1000587067>
ICMTS 1998 : proceedings of the 1998 International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan / sponsored by the IEEE Electron Devices Society
: softbound,: casebound,: microfiche. - Piscataway : IEEE Service Center , c1998
図書 <1001000974>
Reliability physics
1987-1993 - 1993. - New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, , 1970-1993
図書 <1000684614>
IEEE international reliability physics proceedings / sponsored by the IEEE Electronic Devices Society and the IEEE Reliability Society
1994- - 1998. - Piscataway, N.J. : The Societies , c1994-
図書 <1000693950>
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
Los Alamitos, Calif. : IEEE Computer Society Press , 1990
図書 <1000654808>
Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989
Washington, D.C. : IEEE Computer Society Press , c1989
図書 <1000645796>
Proceedings / International Test Conference
1992 - 1998. - Silver Spring, Md : IEEE Computer Society Press , c1983-
図書 <1000672714>