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検索キーワード:(件名: Automatic checkout equipment Congresses)
該当件数:9件
Autotestcon '87 : proceedings, San Francisco, November 3-5, IEEE International Automatic Testing Conference, Moscone Center, San Francisco, CA / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]
New York, N.Y. ; Piscataway, NJ : IEEE : Copies from Order Dept., IEEE , c1987
図書 <1000633389>
Conference record / Autotestcon
1989,1990,1992. - New York, NY : IEEE , c1989-1992
図書 <1000659807>
Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989
Washington, D.C. : IEEE Computer Society Press , c1989
図書 <1000645796>
Proceedings : AUTOTESTCON 93, September 20-23, 1993 : IEEE Systems Readiness Technology Conference, San Antonio Convention Center, San Antonio, Texas / sponsored by: the Institute of Electrical and Electronics Engineers ... [et al.]
: soft.,: case.,: micro.. - Piscataway : IEEE Service Center , c1993
図書 <1000483841>
1995,1996. - [New York, N.Y.] : Institute of Electrical and Electronics Engineers , c1995-c1996
図書 <1000693996>
IEEE Autotestcon proceedings
1997,1998. - [New York, N.Y.] : Institute of Electrical and Electronics Engineers , c1997-
図書 <1000672770>
Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / sponsored by the IEEE Computer Society, IEEE Philadelphia Section
Washington, D.C. ; Los Angeles, CA : Computer Society Press of the IEEE : Order from Computer Society of the IEEE , c1987
図書 <1000631606>
New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section
Washington, D.C. : Computer Society Press of the IEEE , c1988
図書 <1000587067>
The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
Los Alamitos, Calif. : IEEE Computer Society Press , 1990
図書 <1000654808>