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New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

データ種別 図書
出版者 Washington, D.C. : Computer Society Press of the IEEE
出版年 c1988
大きさ xxx, 1005 p. : ill. ; 28 cm

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2号館集密書庫(図書) TK:7874:I593:1988
0818608706 880394963

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別書名 IEEE Conference Publications
一般注記 "Computer Society order number 870."
"IEEE catalog number 88CH2610-4."
Includes bibliographies and index
著者標目 *International Test Conference. (1988 : Washington, D.C.)
IEEE Computer Society. Test Technology Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
件 名 LCSH:Integrated circuits -- Testing Congresses  全ての件名で検索
LCSH:Electronic digital computers -- Circuits Testing Congresses  全ての件名で検索
LCSH:Automatic checkout equipment -- Congresses  全ての件名で検索
分 類 LCC:TK7874
DC19:621.395
巻冊次 ISBN:0818608706 REFWLINK
ISBN 0818608706
目次/あらすじ

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