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Handbook of nanoscopy / edited by Gustaaf Van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook

データ種別	図書
出版情報	Weinheim : Wiley-VCH , c2012
本文言語	英語
大きさ	2 v. : ill. (some col.) ; 25 cm

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配架場所	請求記号	巻　次	ISBN	資料番号	資料状態	利用注記	コメント	予約・取寄	申込書	仮想書架
書庫2階	QH:205.2:H36:2012:v.1	v. 1		006312657				予約・取寄		仮想書架	予約・取寄		仮想書架
書庫2階	QH:205.2:H36:2012:v.2	v. 2		006312648				予約・取寄		仮想書架	予約・取寄		仮想書架

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内容注記	v.1. The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck Transmission electron microscopy / Marc De Graef Atomic resolution electron microscopy / Dirk Van Dyck Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] Z-contrast imaging / Stephen J. Pennycook ... [et al.] Electron holography / Hannes Lichte Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] Electron tomography / Paul Anthony Midgley and Sara Bals Statistical parameter estimation theory -- a tool for quantitative electron microscopy / Sandra Van Aert Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes Speckles in images and diffraction patterns / Michael M. J. Treacy Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken Scanning probe microscopy -- history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk Scanning probe microscopy -- forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] Scanning beam methods / David Joy Fundamentals of the focused ion beam system / Nan Yao v.2. Low-energy electron microscopy / Ernst Bauer Spin-polarized low-energy electron microscopy / Ernst Bauer Imaging secondary ion mass spectroscopy / Katie L. Moore, Markus Schröder, and Chris R. M. Grovenor Soft x-ray imaging and spectromicroscopy / Adam P. Hitchcock Atom probe tomography: principle and applications / Frederic Danoix and François Vurpillot Signal and noise maximum likelihood estimation in MRI / Jan Sijbers 3-D surface reconstruction from stereo scanning electron microscopy images / Shafik Huq, Andreas Koschan, and Mongi Abidi Nanoparticles / Miguel López-Haro ... [et al.] Nanowires and nanotubes / Yong Ding and Zhong Lin Wang Carbon nanoforms / Carla Bittencourt and Gustaaf Van Tendeloo Metals and alloys / Dominique Schryvers In situ transmission electron microscopy on metals / J.Th.M. De Hosson Semiconductors and semiconducting devices / Hugo Bender Complex oxide materials / Maria Varela ... [et al.] Application of transmission electron microscopy in the research of inorganic photovoltaic materials / Yanfa Yan Polymers / Joachim Loos Ferroic and multiferroic materials / Ekhard Salje Three-dimensional imaging of biomaterials with electron tomography / Montserrat Bárcena, Roman I. Koning, and Abraham J. Koster Small organic molecules and higher homologs / Ute Kolb and Tatiana E. Gorelik
一般注記	Includes bibliographical references
著者標目	Tendeloo, G. Van (Gustaaf) Van Dyck, Dirk Pennycook, Stephen J.
件　名	LCSH:Microscopy LCSH:Nanotechnology
分　類	DC23:502.82
巻冊次	: [set] ; ISBN:9783527317066 ; XISBN:3527317066 v. 1 v. 2
ISBN	9783527317066

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