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検索キーワード:(件名: #Testing)
該当件数:158件
Principles of testing electronic systems / Samiha Mourad, Yervant Zorian
New York : John Wiley & Sons , c2000
図書 <1001231825>
Industrial color testing : fundamentals and techniques / Hans G. Völz ; translated by Ben Teague
2nd, completely rev. ed. - Weinheim ; New York : Wiley-VCH , 2001
図書 <1001367522>
Failure analysis of paints and coatings / Dwight G. Weldon
Chichester ; New York : John Wiley & Sons , c2001
図書 <1001280095>
Principles of semiconductor network testing / Amir Afshar
Boston : Butterworth-Heinemann , c1995
図書 <1000536144>
Essentials of creativity assessment / James C. Kaufman, Jonathan A. Plucker, John Baer
: pbk. - Hoboken, N.J. : Wiley , c2008. - (Essentials of psychological assessment series)
図書 <1002563111>
Measuring stress in humans : a practical guide for the field / edited by Gillian H. Ice and Gary D. James
Cambridge : Cambridge University Press , 2007. - (Cambridge studies in biological and evolutionary anthropology)
図書 <1001802964>
Measuring social attitudes : a handbook for researchers and practitioners / Daniel J. Mueller
New York : Teachers College Press , c1986
図書 <1000619605>
Kleinkindertests : Entwicklungstests vom 1. bis 6. Lebensjahr / Charlotte Bühler, Hildegard Hetzer
4 Aufl. - Berlin : Springer , 1977
図書 <1000516146>
Nuclear weapons and security : the effects of alternative test ban treaties / edited by Jonathan Medalia, Paul Zinsmeister, Robert Civiak
Boulder : Westview Press , 1991
図書 <1000427521>
Oscillation-based test in mixed-signal circuits / by Gloria Huertas Sánchez ... [et al.]
Dordrecht : Springer , c2006. - (Frontiers in electronic testing ; 36)
図書 <1001819577>
Antenna measurement techniques / Gary E. Evans
Boston : Artech House , c1990. - (Artech House antenna library)
図書 <1000393650>
Language assessment for remediation / David J. Müller, Siân M. Munro and Christopher Code
: pbk. - London : Croom Helm , c1981
図書 <1000603275>
Learning potential assessment and cognitive training : actual research and perspectives in theory building and methodology / edited by G. M. van der Aalsvoort, W. C. M. Resing, A. J. J. M. Ruijssenaars
Amsterdam : JAI Press , 2002. - (Advances in cognition and educational practice ; v. 7)
図書 <1001376430>
Measuring self-concept across the life span : issues and instrumentation / Barbara M. Byrne
:soft cover. - Washington, DC : American Psychological Association , c1996. - (Measurement and instrumentation in psychology)
図書 <1000703686>
ICMTS 1998 : proceedings of the 1998 International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan / sponsored by the IEEE Electron Devices Society
: softbound,: casebound,: microfiche. - Piscataway : IEEE Service Center , c1998
図書 <1001000974>
Analysis of microelectronic materials and devices / edited by M. Grasserbauer and H.W. Werner
Chichester ; New York : Wiley , c1991
図書 <1000447398>
Characterization of composite materials / editor, Hatsuo Ishida
New York : Momentum Press , 2010. - (Materials characterization series)
図書 <1002217662>
Mechanical behavior of materials : engineering methods for deformation, fracture, and fatigue / Norman E. Dowling
4th ed. - Boston : Pearson , c2013
図書 <1002554348>
Cultural diversity and learning efficiency : recent developments in assessment / edited by Rajinder M. Gupta and Peter Coxhead
New York : St. Martin's Press , 1988
図書 <1000628348>
Seeing and hearing and space and time / N. O'Connor and B. Hermelin
London ; New York : Academic Press , 1978
図書 <1000337441>