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RT Book, Whole SR Print DC OPAC T1 Annual IEEE Semiconductor Thermal Measurement and Management Symposium A1 IEEE Semiconductor Thermal Measurement and Management Symposium A1 IEEE Components, Hybrids, and Manufacturing Technology Society YR 1991 FD c1991- VO 1991- VO 1991 VO 1992 VO 1993 VO 1994 VO 1997 VO 1998 SP v. K1 Semiconductors -- Thermal properties -- Congresses K1 Semiconductors -- Cooling -- Congresses K1 Amorphous semiconductors -- Thermal properties -- Congresses K1 Integrated circuits -- Congresses PB IEEE PP New York, NY LA English (英語) CL LCC:TK7871.85 NO Current Frequency:Annual NO 7th (Feb. 12-14, 1991)- . -- NO Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society NO 書誌ID=1000688326; LK [OPAC]https://www.lib.sophia.ac.jp/opac/opac_link/bibid/1000688326 OL 30