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RT Book, Whole SR Print DC OPAC T1 Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar T2 Wiley series in probability and mathematical statistics A1 Meeker, William Q. A1 Escobar, Luis, 1944- YR 1998 FD c1998 SP xxii, 680 p. K1 Reliability (Engineering) -- Statistical methods PB Wiley PP New York SN 0471143286 LA English (英語) CL NDC9:509.6 CL LCC:TS173 CL DC21:620/.00452 NO "A Wiley-Interscience publication." NO Bibliography : p. 645-663 NO Includes index NO 書誌ID=0219026880; NCID=BA37266814; LK [OPAC]https://www.lib.sophia.ac.jp/opac/opac_link/bibid/0219026880 OL 30