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RT Book, Whole SR Print DC OPAC T1 The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section A1 International Test Conference (21st : 1990 : Washington, D.C.) A1 IEEE Computer Society. Test Technology Technical Committee. A1 IEEE Computer Society. Philadelphia Chapter. YR 1990 FD 1990 SP xvi, 1083 p. K1 Integrated circuits -- Testing -- Congresses K1 Electronic digital computers -- Circuits -- Testing -- Congresses K1 Automatic checkout equipment -- Congresses K1 Semiconductors -- Testing -- Congresses PB IEEE Computer Society Press PP Los Alamitos, Calif. SN 081869064X LA English (英語) CL LCC:TK7874 CL DC20:621.381/5 NO "IEEE catalog number 90CH2910-6"--T.p. verso NO Includes bibliographical references and index NO 書誌ID=1000654808; LK [OPAC]https://www.lib.sophia.ac.jp/opac/opac_link/bibid/1000654808 OL 30