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RT Book, Whole SR Print DC OPAC T1 New frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC / sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section A1 International Test Conference. (1988 : Washington, D.C.) A1 IEEE Computer Society. Test Technology Technical Committee. A1 Institute of Electrical and Electronics Engineers. Philadelphia Section. YR 1988 FD c1988 SP xxx, 1005 p. K1 Integrated circuits -- Testing Congresses K1 Electronic digital computers -- Circuits Testing Congresses K1 Automatic checkout equipment -- Congresses PB Computer Society Press of the IEEE PP Washington, D.C. SN 0818608706 CL LCC:TK7874 CL DC19:621.395 NO "Computer Society order number 870." NO "IEEE catalog number 88CH2610-4." NO Includes bibliographies and index NO 書誌ID=1000587067; LK [OPAC]https://www.lib.sophia.ac.jp/opac/opac_link/bibid/1000587067